Thin Film Laboratories

University of Tehran

 

 

University of Tehran

 

   

I-V , C-V Kithley Systems (Four-Point Probe)

Four-Point Probe is used for characterizing the electrical behavior of the electronic devices as well as the sheet resistance measurements. Another well-known application of this system is the C-V measurements. High precision sweeping of voltage, current and frequency is from the main features of this system.

 

 

 
 
 
 

 

 

 

 

 

 

 

 
 

 

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